Figure2

Structure-property modeling scheme based on optimized microstructural information by two-point statistics and principal component analysis

Figure 2. Example of a microstructure and corresponding autocorrelations: (A) schematic diagram of sample preparation; (B) binarized micrograph; (C) autocorrelations of the black phase; and (D) enlarged drawing of the central domain in (C) labeled by the dotted black circle.

Journal of Materials Informatics
ISSN 2770-372X (Online)
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