fig5

Integrating computational materials science and materials informatics for the modeling of phase stability

Figure 5. Transmission electron microscopy images and diffraction analysis of a grain with a size of 166 nm[96]: (A) bright-field image; (B) corresponding diffraction pattern and indexing, triangles indicating the 2:17R superstructure reflections; and (C) dark-field image reflecting the twin variants (displayed as red and green), indicating the single 2:17R phase of the whole grain.

Journal of Materials Informatics
ISSN 2770-372X (Online)
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